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Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.12008/42664 How to cite
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dc.contributor.authorLezama, Josées
dc.contributor.authorRandall, Gregoryes
dc.contributor.authorMorel, Jean-Micheles
dc.contributor.authorGrompone von Gioi, Rafaeles
dc.date.accessioned2024-02-26T19:52:31Z-
dc.date.available2024-02-26T19:52:31Z-
dc.date.issued2015es
dc.date.submitted20240223es
dc.identifier.citationLezama, J, Randall, G, Morel, J-M, Grompone von Gioi, R."Good continuation in dot patterns: A quantitative approach based on local symmetry and non-accidentalness". Vision Research, v. 126, 2016, pp 183-191, DOI https://doi.org/10.1016/j.visres.2015.09.004.es
dc.identifier.urihttps://hdl.handle.net/20.500.12008/42664-
dc.description.abstractWe propose a novel approach to the grouping of dot patterns by the good continuation law. Our model is based on local symmetries, and the non-accidentalness principle to determine perceptually relevant configurations. A quantitative measure of non-accidentalness is proposed, showing a good correlation with the visibility of a curve of dots. A robust, unsupervised and scale-invariant algorithm for the detection of good continuation of dots is derived. The results of the proposed method are illustrated on various datasets, including data from classic psychophysical studies. An online demonstration of the algorithm allows the reader to directly evaluate the method.es
dc.languageenes
dc.publisherElsevieres
dc.relation.ispartofVision Research, v. 126, 2016es
dc.rightsLas obras depositadas en el Repositorio se rigen por la Ordenanza de los Derechos de la Propiedad Intelectual de la Universidad De La República. (Res. Nº 91 de C.D.C. de 8/III/1994 – D.O. 7/IV/1994) y por la Ordenanza del Repositorio Abierto de la Universidad de la República (Res. Nº 16 de C.D.C. de 07/10/2014)es
dc.subjectGestaltes
dc.subjectGood continuationes
dc.subjectDotses
dc.subjectNon-accidentalnesses
dc.subjectLocal symmetryes
dc.subject.otherProcesamiento de Señaleses
dc.titleGood continuation in dot patterns : A quantitative approach based on local symmetry and non-accidentalnesses
dc.typeArtículoes
dc.rights.licenceLicencia Creative Commons Atribución (CC - By 4.0)es
dc.identifier.doihttps://doi.org/10.1016/j.visres.2015.09.004.es
udelar.academic.departmentProcesamiento de Señales-
udelar.investigation.groupTratamiento de Imágenes-
Appears in Collections:Publicaciones académicas y científicas - Instituto de Ingeniería Eléctrica

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