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Title: | SMOS images restoration from L1A data : a sparsity-based variational approach |
Authors: | Preciozzi, Javier Musé, Pablo Almansa, Andrés Durand, Sylvain Khazaal, Ali Rougé, Bernard |
Type: | Ponencia |
Keywords: | SMOS, MIRAS, RFI, Non-differentiable, Convex optimization, Total variation minimization |
Descriptors: | Procesamiento de Señales |
Issue Date: | 2014 |
Abstract: | Data degradation by radio frequency interferences (RFI) is one of the major challenges that SMOS and other interferometers radiometers missions have to face. Although a great number of the illegal emitters were turned off since the mission was launched, not all of the sources were completely removed. Moreover, the data obtained previously is already corrupted by these RFI. Thus, the recovery of brightness temperature from corrupted data by image restoration techniques is of major interest. In this work we propose a variational approach to recover a super-resolved, denoised brightness temperature map based on two spatial components: an image uthat models the brightness temperature and an image o modeling the RFI. The approach is totally new to our knowledge, in the sense that it is directly and exclusively based on the visibilities (L1a data), and thus can also be considered as an alternative to other brightness temperature recovery methods. |
Description: | Trabajo aceptado en Geoscience and Remote Sensing Symposium, Quebec, Canada, 13-18 jul., 2014 |
Citation: | Freciozzi, J, Musé, P, Almansa, A, Durand, S, Khazaal, A, Rougé, B, "SMOS images restoration from L1A data : a sparsity-based variational approach" Proceedings of the IEEE Geoscience and Remote Sensing Symposium, Quebec, Canada, 13-18 jul, 2014, pp. 2487-2490, doi: 10.1109/IGARSS.2014.6946977. |
Academic department: | Procesamiento de Señales |
Investigation group: | Tratamiento de Imágenes |
License: | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
Appears in Collections: | Publicaciones académicas y científicas - Instituto de Ingeniería Eléctrica |
This item is licensed under a Creative Commons License