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Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.12008/41813 How to cite
Title: Finding vanishing points via point alignments in image primal and dual domains
Authors: Morel, Jean-Michel
Randall, Gregory
Grompone von Gioi, Rafael
Lezama, José
Type: Ponencia
Keywords: Vanishing point detection, Line-to-point mapping, 2d point alignments
Descriptors: Procesamiento de Señales
Issue Date: 2014
Abstract: We present a novel method for automatic vanishing point detection based on primal and dual point alignment detection. The very same point alignment detection algorithm is used twice: First in the image domain to group line segment endpoints into more precise lines. Second, it is used in the dual domain where converging lines become aligned points. The use of the recently introduced PClines dual spaces and a robust point alignment detector leads to a very accurate algorithm. Experimental results on two public standard datasets show that our method significantly advances the state-of-the-art in the Manhattan world scenario, while producing state-of-the-art performances in non-Manhattan scenes.
Description: Trabajo publicado en IEEE Conference on Computer Vision and Pattern Recognition, la versión open access que se publica es suministrada por Computer Vision Foundation. La versión autorizada puede consultarse en IEEE Xplore. DOI: 10.1109/CVPR.2014.72
Publisher: Computer Vision Foundation
IN: Conference pone von Gioi, R, Randall, G, Morel, J.M."Finding Vanishing Points via Point Alignments in Image Primal and Dual Domains," Conference on Computer Vision and Pattern Recognition, Columbus, OH, USA, 23-28 jun., 2014
Citation: Lezama, J, Grompone von Gioi, R, Randall, G, Morel, J.M."Finding Vanishing Points via Point Alignments in Image Primal and Dual Domains," Conference on Computer Vision and Pattern Recognition, Columbus, OH, USA, 23-28 jun., 2014.
Academic department: Procesamiento de Señales
Investigation group: Tratamiento de Imágenes
License: Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)
Appears in Collections:Publicaciones académicas y científicas - Instituto de Ingeniería Eléctrica

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