Por favor, use este identificador para citar o enlazar este ítem:
https://hdl.handle.net/20.500.12008/41785
Cómo citar
| Título: | Temperature controlled measurement system for precise characterization of electronic circuits and devices |
| Autor: | Aguirre, Pablo Rossi, Conrado |
| Tipo: | Ponencia |
| Descriptores: | Electrónica |
| Fecha de publicación: | 2014 |
| Resumen: | A temperature controlled oven, with provisions for easy connection of instruments to the device under test, was designed and built. This paper describes the oven, its thermal model and control system and presents measurement results with different temperature profiles. An NTC thermistor measures the system temperature and a modified Steinhart Hart equation is used to convert resistance readings to temperature. The system is capable of setting its temperature from just over ambient temperature up to 375 K (around 102 ∘C). Temperature stability is ultimately limited by the resolution of temperature measurement to ±2 mK |
| Descripción: | Trabajo presentado a International Instrumentation and Measurement Technology Conference (I2MTC) Montevideo, Uruguay, 12-15 may., 2014 |
| Citación: | Aguirre, P, Rossi Aicardi, C. "Temperature controlled measurement system for precise characterization of electronic circuits and devices" Publicado en: Proceedings of the International Instrumentation and Measurement Technology Conference (I2MTC). Montevideo, Uruguay, 12-15 may., 2014, p. 1492-1495, doi: 10.1109/I2MTC.2014.6860994. |
| Departamento académico: | Electrónica |
| Grupo de investigación: | Microelectrónica |
| Aparece en las colecciones: | Publicaciones académicas y científicas - Instituto de Ingeniería Eléctrica |
Ficheros en este ítem:
| Fichero | Descripción | Tamaño | Formato | ||
|---|---|---|---|---|---|
| AR14.pdf | 1,14 MB | Adobe PDF | Visualizar/Abrir |
Este ítem está sujeto a una licencia Creative Commons Licencia Creative Commons
