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| Campo DC | Valor | Lengua/Idioma |
|---|---|---|
| dc.contributor.author | Aguirre, Pablo | es |
| dc.contributor.author | Rossi, Conrado | es |
| dc.date.accessioned | 2023-12-11T19:57:45Z | - |
| dc.date.available | 2023-12-11T19:57:45Z | - |
| dc.date.issued | 2014 | es |
| dc.date.submitted | 20231211 | es |
| dc.identifier.citation | Aguirre, P, Rossi Aicardi, C. "Temperature controlled measurement system for precise characterization of electronic circuits and devices" Publicado en: Proceedings of the International Instrumentation and Measurement Technology Conference (I2MTC). Montevideo, Uruguay, 12-15 may., 2014, p. 1492-1495, doi: 10.1109/I2MTC.2014.6860994. | es |
| dc.identifier.uri | https://hdl.handle.net/20.500.12008/41785 | - |
| dc.description | Trabajo presentado a International Instrumentation and Measurement Technology Conference (I2MTC) Montevideo, Uruguay, 12-15 may., 2014 | es |
| dc.description.abstract | A temperature controlled oven, with provisions for easy connection of instruments to the device under test, was designed and built. This paper describes the oven, its thermal model and control system and presents measurement results with different temperature profiles. An NTC thermistor measures the system temperature and a modified Steinhart | es |
| dc.description.abstract | Hart equation is used to convert resistance readings to temperature. The system is capable of setting its temperature from just over ambient temperature up to 375 K (around 102 ∘C). Temperature stability is ultimately limited by the resolution of temperature measurement to ±2 mK | es |
| dc.language | en | es |
| dc.rights | Las obras depositadas en el Repositorio se rigen por la Ordenanza de los Derechos de la Propiedad Intelectual de la Universidad De La República. (Res. Nº 91 de C.D.C. de 8/III/1994 – D.O. 7/IV/1994) y por la Ordenanza del Repositorio Abierto de la Universidad de la República (Res. Nº 16 de C.D.C. de 07/10/2014) | es |
| dc.subject.other | Electrónica | es |
| dc.title | Temperature controlled measurement system for precise characterization of electronic circuits and devices | es |
| dc.type | Ponencia | es |
| dc.rights.licence | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) | es |
| udelar.academic.department | Electrónica | - |
| udelar.investigation.group | Microelectrónica | - |
| Aparece en las colecciones: | Publicaciones académicas y científicas - Instituto de Ingeniería Eléctrica | |
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| Fichero | Descripción | Tamaño | Formato | ||
|---|---|---|---|---|---|
| AR14.pdf | 1,14 MB | Adobe PDF | Visualizar/Abrir |
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