Listar por Autor Barragán, Manuel J
Mostrando resultados 1 a 3 de 3
Fecha de publicación | Título | Autor(es) |
2009 | A BIST solution for the functional characterization of RF systems based on envelope response analysis | Barragán, Manuel J; Fiorelli, Rafaella; Vázquez, Diego; Rueda, Adoración; Huertas, José Luis |
2010 | Low-cost signature test of Rf blocks based on envelope response analysis | Barragán, Manuel J; Fiorelli, Rafaella; Vázquez, Diego; Rueda, Adoración; Huertas, José Luis |
2010 | On-chip characterization of RF systems based on envelope response analysis | Barragán, Manuel J; Fiorelli, Rafaella; Vázquez, Diego; Rueda, Adoración; Huertas, José Luis |