Por favor, use este identificador para citar o enlazar este ítem:
https://hdl.handle.net/20.500.12008/38642
Cómo citar
| Título: | A BIST solution for the functional characterization of RF systems based on envelope response analysis |
| Autor: | Barragán, Manuel J Fiorelli, Rafaella Vázquez, Diego Rueda, Adoración Huertas, José Luis |
| Tipo: | Ponencia |
| Fecha de publicación: | 2009 |
| Resumen: | This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and spectral analysis of the two-tone response envelope of the block under test. The main non-linearity specifications of the block under test can be easily extracted from the envelope signal. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach. |
| Editorial: | IEEE |
| EN: | 18th Asian Test Symposium, ATS 2009,Taichung, Taiwan, 2009 |
| Citación: | Barragán, M, Fiorelli, R, Vázquez, D, Rueda, A, Huertas, J. “A BIST solution for the functional characterization of RF systems based on envelope response analysis”. Proceedings of the 18th Asian Test Symposium, ATS 2009,Taichung, Taiwan, 2009. doi: 10.1109/ATS.2009.14 |
| Licencia: | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| Aparece en las colecciones: | Publicaciones académicas y científicas - Instituto de Ingeniería Eléctrica |
Ficheros en este ítem:
| Fichero | Descripción | Tamaño | Formato | ||
|---|---|---|---|---|---|
| BFVRH09a.pdf | 223 kB | Adobe PDF | Visualizar/Abrir |
Este ítem está sujeto a una licencia Creative Commons Licencia Creative Commons
