Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.12008/32860
How to cite
| Title: | Field-of-view extension and XY-drift correction in microscopy for large samples |
| Authors: | Silva, Alejandro Arocena, Miguel Alonso, Julia R. |
| Type: | Preprint |
| Keywords: | Microscopio, Impresión 3D, Muestras |
| Issue Date: | 2022 |
| Abstract: | We propose a method for sample XY-drift correction by means of feature detection and correlation analysis along with field-of-view extension for large sample images taken through a microscope with a motorized XY stage. |
| IN: | Imaging and Applied Optics Congress, 11 -15 july 2022 |
| Sponsors: | Agencia Nacional de Investigación e Innovación ANII (Grant number FMV_2019_1_156126). |
| Citation: | Silva, A., Arocena, M. y Alonso, J. Field-of-view extension and XY-drift correction in microscopy for large samples [Preprint] Publicado en : Imaging and Applied Optics Congress , 11 -15 july, 2022. |
| License: | Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0) |
| Appears in Collections: | Publicaciones académicas y científicas - Facultad de Ingeniería |
This item is licensed under a Creative Commons License
