Título:
Temperature controlled measurement system for precise characterization of electronic circuits and devices
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Autor:
Aguirre, Pablo
Rossi, Conrado
Rossi, Conrado
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Tipo de documento:
Ponencia
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Descriptores:
Electrónica
Año de publicación:
2014
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Resumen:
A temperature controlled oven, with provisions for easy connection of instruments to the device under test, was designed and built. This paper describes the oven, its thermal model and control system and presents measurement results with different temperature profiles. An NTC thermistor measures the system temperature and a modified Steinhart
Hart equation is used to convert resistance readings to temperature. The system is capable of setting its temperature from just over ambient temperature up to 375 K (around 102 ∘C). Temperature stability is ultimately limited by the resolution of temperature measurement to ±2 mK
Hart equation is used to convert resistance readings to temperature. The system is capable of setting its temperature from just over ambient temperature up to 375 K (around 102 ∘C). Temperature stability is ultimately limited by the resolution of temperature measurement to ±2 mK
Descripción:
Trabajo presentado a International Instrumentation and Measurement Technology Conference (I2MTC) Montevideo, Uruguay, 12-15 may., 2014
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Citación:
Aguirre, P, Rossi Aicardi, C. "Temperature controlled measurement system for precise characterization of electronic circuits and devices" Publicado en: Proceedings of the International Instrumentation and Measurement Technology Conference (I2MTC). Montevideo, Uruguay, 12-15 may., 2014, p. 1492-1495, doi: 10.1109/I2MTC.2014.6860994.
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Departamento académico:
Electrónica
Grupo de investigación:
Microelectrónica
Licencia:
Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)
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| Ficheros | Descripción | Tamaño | Formato | ||
|---|---|---|---|---|---|
| AR14.pdf | — | 1.11 MB | Adobe PDF |