Título:
Low-cost signature test of Rf blocks based on envelope response analysis
Otros títulos:
Coordinador:
Director:
Compilador:
Autor:
Barragán, Manuel J
Fiorelli, Rafaella
Vázquez, Diego
Rueda, Adoración
Huertas, José Luis
Fiorelli, Rafaella
Vázquez, Diego
Rueda, Adoración
Huertas, José Luis
Tutor:
Tipo de documento:
Preprint
Editor:
Palabras clave:
Descriptores:
Año de publicación:
2010
Contenido:
Resumen:
This paper presents a novel and low-cost methodology that can be used for testing RF blocks embedded in complex SoCs. It is based on the detection and analysis of the two-tone response envelope of the device under test (DUT). The response envelope is processed to obtain a simple digital signature sensitive to key specifications of the DUT. The analytical basis of the proposed methodology is demonstrated, and a proposal for its implementation as a built-in test core is discussed. Finally, practical simulation examples show the feasibility of the approach
Descripción:
metadata.articulos.dc.description.uri:
Editorial:
EN:
Financiadores:
Citación:
Barragán, M, Fiorelli, R, Vázquez, D, Rueda, A, Huertas, J. “Low-cost signature test of Rf blocks based on envelope response analysis.” [Preprint] Publicado en 15th IEEE Proceedings of the European Test Symposium, 24-28 May 2010. DOI: 10.1109/ETS16589.2010 sian Test Symposiu
Citación:
metadata.articulos.cc.license.name:
ISBN:
e-ISBN:
ISSN:
ISMN:
Otros identificadores:
Cobertura geográfica:
Cobertura temporal:
Departamento académico:
Grupo de investigación:
Licencia:
Licencia Creative Commons Atribución - No Comercial - Sin Derivadas (CC - By-NC-ND 4.0)
Colecciones:
| Ficheros | Descripción | Tamaño | Formato | ||
|---|---|---|---|---|---|
| BFVRH10a.pdf | — | 710.46 KB | Adobe PDF |